SD Memory Cards

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The latest SD memory card series S-30 and S-50 are based on 3D NAND TLC and offer best cost efficiency. The S-30 is targeting highly cost sensitive read mostly applications while the S-50 is a true industrial SD Card for all use cases. For high endurance demand the pSLC version S-56 is the ideal solution. These cards support Class 10, U3 mode.

The continued series S-45 (MLC version), S-46 (pSLC version), S-450 (SLC version) and S-455 (SLC version) include the same set of sophisticated features and, through the implementation of UHS-I, support data transfer rates of up to 90 MB/s. The combination of MLC (Multi Level Cell) NAND Flash with an industrial controller and page based firmware technology enables prolonged data retention and extended life cycles despite the write endurance limitations of MLC Flash. The S-45, S-46 and S-455 SD memory cards excel with a random write data rate of up to 1400 IOPS.

The special firmware features in the latest series include a powerful built-in Error Correction, Read Retry, Autonomous Data Care Management, Life Time Monitoring & diagnostic features, Randomizer, Wear Leveling & Bad Block Management algorithms and intelligent Power Fail Protection.

All Swissbit SD Cards can withstand extreme environmental conditions. They provide the highest level of mechanical stability and enhanced ESD protection. Furthermore, the hard gold SD connectors endure a minimum of 20,000 insertion cycles.

Series Name

S-200 / S-250

S-455 / S-450

S-46 / S-45

S-30

S-56 / S-50

Interface

Data Transfer Mode

SD 2.0, Class 6

SD 3.0, Class 10, UHS-I

SD 6.1, Class 10, UHS-I, V30, A1

SD 6.1, Class 10, UHS-I, A1

Connector

SD

Outline Dimensions

32 x 24 x 2.1 mm

Flash Type

SLC

S-46: pSLC everbit
S-45: MLC durabit

3D NAND TLC

3D NAND pSLC / TLC

Density Range

S-200: 512 MB–2 GB
S-250: 512 MB-2 GB

512 MB-32 GB

S-46: 2-64 GB
S-45: 4-128 GB
32-256 GB

S-56: 4-64 GB
S-50: 16-256 GB

Status

S-200 EOL planned
S-250 New

Active

New

New

Data Retention

10 years @ life begin
1 year @ life end

Endurance

(Flash Cell Level)

100k P/E Cycles

100k P/E Cycles

S-455:
endurance optimized

S-46: 20k P/E Cycles
S-45: 3k P/E Cycles

1k P/E Cycles

S-56: 30k P/E Cycles
S-50: 3k P/E Cycles

Operating Temperature

Extended: -25°C to +85°C
Industrial: -40°C to +85°C

Extended:
-25°C to +85°C

Extended:
-25°C to +85°C
Industrial:
-40°C to +85°C

Storage Temperature

-40°C to +100°C

-40°C to +85°C

-40°C to +100°C

Performance

Sequential Read (MB/s)

Sequential Write (MB/s)

Random 4KB Read (IOPS)

Random 4KB Write (IOPS)

 

up to 24
up to 13.5
up to 1,580
up to 21

 

up to 44 / 88
up to 38 / 73
up to 1,250 / 1,430
up to 1,100 / 28

 

up to 46 / 43
up to 52 / 21
up to 1,440 / 1,200
up to 1,260 / 950

 

up to 95
up to 85
up to 1,700
up to 1,050

 

up to 94 / 94
up to 82 / 37
up to 2,050 / 2,050
up to 820 / 1,360

MTBF

≥ 3,000,000 hours

Shock

1,000 G

1,500 G

Vibration

15 G

50 G

20 G

50 G

Humidity

85 % RH 85°C, 1,000 hrs

Voltage

2.7 – 3.6 V Normal

Power Consumption
Read typ
Write typ

 

40 mA
65 mA

 

75 mA
75 mA

 

80 mA
70 mA

 

80 mA
100mA


110 mA
110 mA

Features & Tools

Proven Power Fail Safety

Sophisticated Wear Leveling & Bad Block management

Diagnostic features & Life Time Monitoring through SD / SPI command set

S-450 block based FTL / S-455, S-45, S-46 page based FTL
Proven Power Fail Safety

Sophisticated Wear Leveling & Bad Block management

Autonomous Data Care Management

SBLTM Tool & SDK for detailed Life Time Monitoring

 

Support SD SPI mode
Static and Dynamic
Wear Leveling
Bad Block Management
Auto-Read Refresh
Embedded Mode

Support SD SPI mode
Proven Power Fail Safety
Sophisticated Wear
Leveling & Bad Block
management
Autonomous Data Care
Management
SBLTM Tool & SDK for
detailed Life Time
Monitoring

 

Product Features

Data care management
Data Care Management

Various effects like data retention, read disturb limits, or temperature can impact data reliability. The latest generation of Swissbit products use special methods to maintain and refresh the data for higher data integrity.

Electrostatic discharge and electromagnetic interference
ESD and EMI safe

The product designs are in line with the latest regulations for electrostatic discharge and electromagnetic interference. Swissbit strives to exceed these limits with our own in-house technology and production capabilities, for example with System-in-Package (SiP) competence.

Life Time Monitoring (LTM)
Life time monitoring (LTM)

The Swissbit Life Time Monitoring feature enables users to access the memory device’s detailed Life Time Status and allows prediction of imminent failure, avoiding unexpected data loss. This feature uses an extended S.M.A.R.T. (Self-Monitoring, Analysis and Reporting Technology) interface or vendor-specific commands to retrieve the Flash product information.

Longevity
Longevity

The longevity product lines use special components with a long-term supply commitment of up to 10 years. These products offer lowest TCO in demanding applications with high requalification cost.

Power Fail Protection & Recovery
Power fail protection

Intelligent Power Fail Protection and Recovery protects data from unexpected power loss. During an unintentional shutdown, firmware routines and an intelligent hardware architecture ensure that all system and user data will be stored to the NAND.

Shock & Vibration
Shock and vibration

Robustness is one of our key specification targets. The design, assembly and use of selected materials guarantee an extremely solid design which has been validated by extensive testing.

Write Amplification Factor
WAF reduction

The WAF (write amplification factor) for MLC-based products is reduced by combining a paged based FW block management with a powerful card architecture and configuration settings.

Wear leveling
Wear leveling

Sophisticated Wear Leveling and Bad Block Management ensure that Flash cells are sparingly and equally used in order to prolong life time of the device.

Wide temperature support
Wide temperature support

Swissbit‘s embedded memory and storage solutions are designed and approved for reliable operation over a wide temperature range. The products are verified at temperature corners and prestressed with a burn-in operating functional test (Test During Burn In – TDBI).