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Industrial SD Speicherkarten

S-50 / S-56 / S-55 / S-58

S-50 / S-56 / S-55 / S-58

  • Industrietauglicher 3D NAND
  • S-56 / S-58: pSLC, S-50 / S-55: TLC
  • Hohe IOPS-Rate und Lebensdauer
  • Autonomes Datenpflegemanagement
  • SD-Karte in Industriequalität
  • Stromausfallschutz und Lesestörungsmanagement
Online kaufen
S-52

S-52

  • Industrietauglicher 3D TLC NAND
  • Optimiert für Nur-Lese-Anwendungen (Automobil) oder sequenzielles, schreibintensives Workload (Videoaufzeichnung)
  • Automobilstandard AEC-Q100-3
Online kaufen
S-600 / S-250

S-600 / S-250

  • Industrietaugliche SLC
  • Höchstleistung bei sequentiellem Lesen/Schreiben
  • Autonomes Datenpflegemanagement
  • SD-Karte in Industriequalität
  • Stromausfallschutz und Lesestörungsmanagement
  • Besonders hohe Widerstandsfähigkeit durch integrierten Chip
Online kaufen


Secure Digital (SD)-Speicherkarten haben eine weit verbreitete Verwendung in Industrie- und Automobilanwendungen, die von Nur-Lese-Anwendungen wie in Navigationssystemen bis hin zur Verwendung als Boot-Medium, für Videoaufzeichnung oder Datenprotokollierung reichen. Swissbits industrietauglichen Secure Digital (SD)-Kartenserien wurden für hohe Dauerleistung und Ausdauer entwickelt und in der Swissbit-eigenen Fabrik hergestellt und getestet, um extremen Umgebungsbedingungen standzuhalten.

Der SLC-basierte S-600 / S-250 bietet höchste Ausdauer und wurde kürzlich eingeführt, um eine längere Lebensdauer zu bieten. Der neue S-52 zielt auf Automobil- und Videoaufzeichnungsanwendungen ab, während S-50 /S-55 auf typische Anwendungsfälle mit hoher Zuverlässigkeit abzielt, wie in Industrieumgebungen üblich. Die 3D-pSLC-Versionen S-56 und insbesondere die S-58-Karten mit hoher Lebensdauer bieten das beste Preis-Leistungs-Verhältnis.

Series Name

S-600

S-52

S-50 / S-55

S-56 / S-58

Interface
Data Transfer Mode

SD 3.0, UHS-1,
speed class 10/U1

SD 6.1, UHS-I, speed class 10/U3/V30/A2
High endurance type

SD 6.1, UHS-I,
speed class 10/U3/V30/A2
High reliability type

Connector

SD

Outline Dimensions

32 x 24 x 2.1 mm

Flash Type

SLC

 3D NAND TLC

3D NAND TLC

 3D NAND pSLC

Density Range

512 MB - 32 GB

32-128 GB

 S-50: 16-512 GB
S-55: 64-512 GB

S-56:   4-128 GB
S-58: 16-128 GB

Data Retention

10 years @ life begin
1 year @ life end

Endurance
(P/E Cycles)

100k

 3k 3k

S-56: up to 100k
S-58: up to 60k

Operating Temperature

Extended: -25°C to +85°C
Industrial: -40°C to +85°C

Storage Temperature

-40°C to +100°C

Performance

Sequential Read (MB/s)
Sequential Write (MB/s)
Random 4KB Read (IOPS)
Random 4KB Write (IOPS)

 

up to 94
up to 50
up to 1,200
up to 1,200

 

up to 95
up to 84
up to 1,960
up to 780

 

up to 97 / 97
up to 39 / 60
up to 4,570 / 1,970
up to 1,940 / 840

 

up to 95 / 97
up to 90 / 84
up to 4,950 / 3,950
up to 1,800 / 1,080

MTBF

≥ 3,000,000 hours

Shock

1,500 G

Vibration

50 G

Humidity

85 % RH 85°C, 1,000 hrs

Voltage

2.7 – 3.6 V

Use Case

Optimized for high read/write traffic for demanding industrial applications.

Optimized for seq. write use cases such as video recording, dash/body cams
Automotive type AEC-100-3

High reliability type
Optimized for random write use cases such as industrial data logging

Features & Tools

Read Disturb Management, Autonomous Data Care Management
Real industrial temperature range with full cross temperature support
Proven FW based Power Fail Safety
Manufactured in a TS 16949 certified factory
SBDMTool & SDK for detailed Life Time Monitoring

Support SD SPI mode
Proven FW based Power Fail Safety
Sophisticated Wear Leveling & Bad Block management
Autonomous Data Care Management
SBDMTool & SDK for detailed Life Time Monitoring
Data care management
Data Care Management

Various effects like data retention, read disturb limits, or temperature can impact data reliability. The latest generation of Swissbit products use special methods to maintain and refresh the data for higher data integrity.

Electrostatic discharge and electromagnetic interference
ESD and EMI safe

The product designs are in line with the latest regulations for electrostatic discharge and electromagnetic interference. Swissbit strives to exceed these limits with our own in-house technology and production capabilities, for example with System-in-Package (SiP) competence.

Life Time Monitoring (LTM)
Life time monitoring (LTM)

The Swissbit Life Time Monitoring feature enables users to access the memory device’s detailed Life Time Status and allows prediction of imminent failure, avoiding unexpected data loss. This feature uses an extended S.M.A.R.T. (Self-Monitoring, Analysis and Reporting Technology) interface or vendor-specific commands to retrieve the Flash product information.

Longevity
Longevity

The longevity product lines use special components with a long-term supply commitment of up to 10 years. These products offer lowest TCO in demanding applications with high requalification cost.

Power Fail Protection & Recovery
Power fail protection

Intelligent Power Fail Protection and Recovery protects data from unexpected power loss. During an unintentional shutdown, firmware routines and an intelligent hardware architecture ensure that all system and user data will be stored to the NAND.

Shock & Vibration
Shock and vibration

Robustness is one of our key specification targets. The design, assembly and use of selected materials guarantee an extremely solid design which has been validated by extensive testing.

Write Amplification Factor
WAF reduction

The WAF (write amplification factor) for MLC-based products is reduced by combining a paged based FW block management with a powerful card architecture and configuration settings.

Wear leveling
Wear leveling

Sophisticated Wear Leveling and Bad Block Management ensure that Flash cells are sparingly and equally used in order to prolong life time of the device.

Wide temperature support
Wide temperature support

Swissbit‘s embedded memory and storage solutions are designed and approved for reliable operation over a wide temperature range. The products are verified at temperature corners and prestressed with a burn-in operating functional test (Test During Burn In – TDBI).