CFast Cards™

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CFast™ cards combine the CompactFlash™ (CF) card form factor and the Serial ATA (SATA) interface into a single product. CFast™ cards can replace both HDDs and CompactFlash™ cards in applications requiring small form factors, high endurance and the ability to withstand shock, vibration, extreme temperatures (-40°C to +85°C), and rough environmental conditions. Swissbit’s CFast™ cards provide rugged and easy replaceable storage for embedded and industrial systems. The Swissbit CFast™ card portfolio covers the range from high-end SLC-based F-600 to the cost/performance optimized F-50. With an equal feature set as the 2.5“ X-60 SSD, the F-60 MLC product and F-66 pSLC card are perfect devices for high performance and endurance and lowest total cost of ownership.

Series Name








Data Transfer Mode

CFast™ 2.0 – SATA III – 6 Gbit/s


CFast™ 1.0 –
SATA II – 3 Gbit/s


CFast™ Type I

Outline Dimensions

36.4 x 42.8 x 3.6 mm

Flash Type


pSLC everbit

MLC durabit




Density Range

8 GB – 64 GB

4 GB – 120 GB

8 GB – 240 GB

4 GB – 128 GB

8 GB – 256 GB

2 GB – 64 GB



EOL planned

Data Retention


10 years @ life begin
1 year @ life end

Endurance [DWPD]

JESD219 Client Endurance Workload






max 2.63

Operating Temperature

Commercial: 0°C to +70°C

Industrial: -40°C to +85°C

Storage Temperature

-40°C to +100°C


Sequential Read (MB/s)

Sequential Write (MB/s)

Random 4KB Read (IOPS)

Random 4KB Write (IOPS)


up to 520

up to 245

up to 76,000

up to 54,000


up to 520

up to 415

up to 80,000

up to 75,000


up to 520

up to 180

up to 72,000

up to 43,000


up to 510

up to 415

up to 32,000

up to 66,000


up to 500

up to 330

up to 53,500

up to 74,000


up to 120

up to 120

up to 3,200

up to 75


≥ 2,000,000 hours

≥ 2,500,000 hours


1,500 G, 0.5 ms duration, half-sine wave

500 G, 1 ms duration, half-sine wave

500 G, 1 ms duration, half-sine wave


50 G, 80-2,000 Hz

20 G, 80-2,000 Hz

20 G


85 % RH 85°C, 1,000 hrs


3.3 V ± 5 %

Power Consumption

Read (Active)
Write (Active)


1.6 W
2.4 W
347 mW
115 mW


1.4 W
1.8 W
380 mW
116 mW


1.2 W
2.1 W
248 mW
17 mW


Max 3.2 W

380 mW
PHYSLP < 80 mA

Features & Tools

Proven Power Fail Safety
Advanced Wear Leveling & Bad Block management
In-field firmware update
SBLTM Tool & SDK for S.M.A.R.T. based Life Time Monitoring
F-6x: AES 256 Encryption (optional)
Proven Power Fail Safety
Sophisticated Wear Leveling &
Bad Block management
Read Disturb Management
Low Power Consumption
Security & SBZoneProtection
features available
SBLTM Tool & SDK for S.M.A.R.T.
based Life Time Monitoring


Product Features

Data care management
Data Care Management

Various effects like data retention, read disturb limits, or temperature can impact data reliability. The latest generation of Swissbit products use special methods to maintain and refresh the data for higher data integrity.

Electrostatic discharge and electromagnetic interference
ESD and EMI safe

The product designs are in line with the latest regulations for electrostatic discharge and electromagnetic interference. Swissbit strives to exceed these limits with our own in-house technology and production capabilities, for example with System-in-Package (SiP) competence.

Life Time Monitoring (LTM)
Life time monitoring (LTM)

The Swissbit Life Time Monitoring feature enables users to access the memory device’s detailed Life Time Status and allows prediction of imminent failure, avoiding unexpected data loss. This feature uses an extended S.M.A.R.T. (Self-Monitoring, Analysis and Reporting Technology) interface or vendor-specific commands to retrieve the Flash product information.


The longevity product lines use special components with a long-term supply commitment of up to 10 years. These products offer lowest TCO in demanding applications with high requalification cost.

Power Fail Protection & Recovery
Power fail protection

Intelligent Power Fail Protection and Recovery protects data from unexpected power loss. During an unintentional shutdown, firmware routines and an intelligent hardware architecture ensure that all system and user data will be stored to the NAND.

Shock & Vibration
Shock and vibration

Robustness is one of our key specification targets. The design, assembly and use of selected materials guarantee an extremely solid design which has been validated by extensive testing.

Temperature sensor
Temperature sensor

The sensor allows the host hardware or software to monitor the memory device temperature to improve data reliability in the target application environment.

TRIM support
Trim support

The TRIM command allows the operating system to inform the SSD which blocks of data are no longer considered in use and can be wiped out internally, which increases system performance in following write accesses. With TRIM Support data scrap can be deleted in advance, which otherwise would slow down future write operations to the involved blocks.

Write Amplification Factor
WAF reduction

The WAF (write amplification factor) for MLC-based products is reduced by combining a paged based FW block management with a powerful card architecture and configuration settings.

Wear leveling
Wear leveling

Sophisticated Wear Leveling and Bad Block Management ensure that Flash cells are sparingly and equally used in order to prolong life time of the device.

Wide temperature support
Wide temperature support

Swissbit‘s embedded memory and storage solutions are designed and approved for reliable operation over a wide temperature range. The products are verified at temperature corners and prestressed with a burn-in operating functional test (Test During Burn In – TDBI).