ストレージ。セキュリティ保護。信頼。
信頼できるパートナーである Swissbit は、産業、セキュリティ、IoT の用途においてデータを確実に保存、保護することで、デジタルでつながる世界を強化します。Swissbit では、耐用期間が長く、信頼性に優れ、カスタムによる最適化により、導入・運営・管理などにかかる総費用(トータルコスト・オブオーナシップ)の低減化が実現する「ドイツ製」の真の産業用ストレージおよびセキュリティ製品を開発および製造しています。

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ニュースおよびプレスリリース
20/12/2022
Swissbit、要求の厳しい過酷な産業用途に向け新しいSLC仕様のSDおよびmicroSDカードを発表
SLC-NAND技術を採用した新しいS-600シリーズは、過酷な産業用途に最高の信頼性と卓越したデータ保持性を提供
Swissbit(日本法人:スイスビットジャパン株式会社、東京都新宿区、代表取締役 友森 健一郎)は、SLC(シングルレベルセル)フラッシュを採用したSDおよびmicroSDカードの最新世代製品として「S-600シリーズ」を発表しました。SDカードタイプのS-600シリーズは512MBから32GBまで、microSDタイプのS-600uは512MBから2GBの製品が取り揃えられています。
技術ノート
03/02/2023
SD Memory Card Design-in
Swissbit has been one of the leading suppliers of SD Memory Cards for industrial use as well as for the automotive industry for many years.
This TechNote was created from this experience. It focuses on the most common problems that may occur during the integration of an SD Memory interface and is intended to serve as guide to avoid these problems.
01/03/2022
Power Failure Testing
A sudden power failure can lead to various problems with flash media, resulting in a total failure, which is the worst case. This can be remedied by storage media that can still write all the data in the cache to the flash, recognizable by the addition PLP (Power Loss Protection).
But how to test the robustness against sudden power failures as part of product qualification? Our latest TechNote gives a detailed insight and provides an instruction for building your own test hardware.
25/01/2022
Comparing Specifications
Whether a flash storage medium is suitable for the intended use case can be determined in advance using the data sheet. Depending on the manufacturer, however, different test methods are used, which means that the resulting values are not always easy to compare with products from other manufacturers.
The typical methods, programs and terms that are used for such measurements are explained in this TechNote to provide a way to better compare the characteristics of different SSDs and match them with the intended use.
27/07/2021
NAND Flash Endurance Testing
Typical application scenarios for NAND flash memory assume a service life of 3–5 years and in some cases even significantly longer. The flash type to be used (SLC, pSLC, MLC, TLC, QLC) is selected accordingly, which has the necessary endurance, i. e. the lifespan measured in erase and programming cycles.
If the specified endurance is to be checked as part of the qualification of a NAND flash memory for a project, the rate of aging has a significant influence on the result.
23/12/2019
Bad Blocks
The presence of factory bad blocks in NAND flash is as much a technology reason as the occurrence of additional bad blocks during the lifetime.
Both are no (negative) quality indications.
However, with the occurrence of bad blocks during the lifetime, the correct handling of these events by the firmware is critical in order not to lose the new data as well as the already stored data of such blocks.
16/12/2019
Performance Tests
To compare speed specifications in data sheets of NAND flash memory media, the test conditions must be identical. If the measurement was not started repeatedly or did not cover the entire logical address space, the specified speed can be significantly higher than the real achievable speed.