USB 驱动器
U-50n / U-56n
- U-56n everbit™ pSLC/U-50n MLC durabit™
- USB 3.1 – 超高速
- 热插拔功能，无数据丢失
- 工业温度范围 -40°C 至 85°C 和 0°C 至 70°C
- 基于页面的 FTL，提供最佳写入性能和耐久性
- 坚固的外壳，带 LED
- 安全选件
U-500k / U-56k / U-50k
- 基于 U-500k SLC 的 NAND
U-56k everbit™ pSLC/U-50k MLC durabit™ - USB 3.1 – 超高速
- 热插拔功能，无数据丢失
- 工业温度范围 -40°C 至 85°C 和 0°C 至 70°C
- 基于页面的 FTL，提供最佳写入性能和耐久性
Swissbit 的 USB 闪存驱动器是设计用于嵌入式和工业应用的高性能、可靠 USB 存储解决方案。Swissbit 采用固定 BOM 的高度可靠 SLC NAND 闪存，包括 pSLC 或 MLC 型号的固件配置，可实现最长的稳定供应。这可降低风险和兼容性问题，并最大程度减少重新评审。
全新 USB 3.1 产品利用基于页面的闪存管理，可显著提高耐久性和写入性能。
|
Series Name |
U-500k |
U-56k |
U-50k |
U-56n | U-50n |
|
Interface |
USB 3.1 |
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Connector |
USB 3.0 Type A-Plug |
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Outline Dimensions |
67.8 x 18.0 x 8.3 mm |
24.0 x 12.1 x 4.5 mm | |||
|
Flash Type |
SLC |
pSLC everbit™ |
MLC durabit™ |
pSLC everbit™ |
MLC durabit™ |
|
Density Range |
2-32 GB |
8-64 GB |
16-128 GB |
4-32 GB | 8-64 GB |
|
Data Retention |
10 years @ life begin / 1 year @ life end |
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Endurance |
93 |
19 |
2.9 |
19 |
2.9 |
|
Operating Temperature |
Commercial: 0°C to +70°C |
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Storage Temperature |
-40°C to +85°C | ||||
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Performance Sequential Read (MB/s) |
up to 180 up to 100 up to 3,700 up to 2,000 |
up to 190 up to 110 up to 4,000 up to 3,200 |
up to 150 up to 60 up to 3,200 up to 900 |
up to 197 up to 126 up to 3,850 up to 2,600 |
up to 156 up to 64 up to 2,850 up to 1,800 |
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MTBF |
≥ 3,000,000 hours |
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|
Shock |
1,500 G |
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Vibration |
50 G |
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Humidity |
85 % RH 85°C, 1000 hrs |
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Voltage |
5 V ± 10 % |
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Features & Tools |
Page based FTL for best write performance and endurance Proven Power Fail Safety Windows / Linux – Spare block read out Bootable USB Drive Supports latest OS as Removable Drive (USB Flash Drive) Shock & vibration resistant |
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eUSB 2.0 模块
U-450 / U-48
- USB 2.0
- 基于 U-450 SLC 的 NAND
U-48 3D NAND pSLC - 基于页面的 FTL，提供高耐久性
- 椭圆形安装孔，用于降低机械应力
- 工业温度范围 -40°C 至 85°C 和 0°C 至 70°C
- 标准和小型连接器
Swissbit 的嵌入式 USB 闪存模块 (UFM) 以小型外形规格提供各种 USB 2.0 存储解决方案。UFM 是用于需要高质量和高可靠性的应用程序的理想解决方案。典型应用包括嵌入式应用和网络控制通信系统的数据记录或启动驱动器。
PCB 上的 10 引脚 USB 连接器支持不同节距尺寸（2.00 mm 和 2.54 mm）。
驱动器以 5V ±10% 或 3.3V ±5%（可选）操作。UFM 还与版本 1.1 向后兼容，且可与支持 USB 大容量存储类规格和批量传输的操作系统配合使用。
|
Series Name |
U-450 |
U-48 |
|
Interface |
USB 2.0 |
|
|
Connector |
Standard: 2.54 mm – 10 Pin (key option) |
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|
Outline Dimensions |
Standard: Low Profile: |
|
|
Flash Type |
SLC |
3D NAND pSLC |
|
Density Range |
1-16GB |
8-16GB |
|
Data Retention |
10 years @ life begin |
|
|
Endurance [DWPD] |
4.2 |
6.2 |
|
Operating Temperature |
Commercial: 0°C to +70°C |
|
|
Storage Temperature |
-40°C to +85°C |
|
|
Performance Sequential Read (MB/s) |
up to 36 |
up to 42 up to 38 up to 2,600 up to 2,000 |
|
MTBF |
≥ 3,000,000 hours |
|
|
Shock |
1500 G |
|
|
Vibration |
50 G |
|
|
Humidity |
85 % RH 85°C, 1000 hrs |
|
|
Voltage |
3.3 V ± 5 % / 5 V ± 10 % |
|
|
Features & Tools |
Page based FTL for best write performance and endurance Proven Power Fail Safety Windows / Linux – Spare block read out Bootable USB Drive Supports latest OS as Fixed Drive (eUSB modules) Connector pitch & key variations available Shock & vibration resistant |
|
eUSB 3.1 模块
U-500 / U-56 / U-58
- 基于 U-500 SLC 的 NAND
U-56 everbit™ pSLC/U-58 3D pSLC - USB 3.1 – 超高速
- 热插拔功能，无数据丢失
- 工业温度范围 -40°C 至 85°C 和 0°C 至 70°C
- 基于页面的 FTL，提供最佳写入性能和耐久性
- 标准和小型连接器
Swissbit 提供采用不同外形规格以及商用和工业工作温度范围的 USB 3.1 产品。凭借先进的 NAND 闪存处理算法、严格的部件选择、PCN 控制以及完整温度范围（−40°C 至 85°C）下的 100% 最终系统测试，Swissbit 的 USB 闪存盘 (UFD) 能够确保符合嵌入式和网络控制通信市场的要求。所有 Swissbit USB 解决方案都融合了安全功能和用于产品寿命控制的寿命监视工具。
|
Series Name |
U-500 |
U-56 |
U-58 |
|
Interface |
USB 3.1 |
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|
Connector |
Standard: 2.54 mm – 10 Pin (key option) |
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|
Outline Dimensions |
Standard: Low Profile: |
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|
Flash Type |
SLC |
pSLC |
3D pSLC |
|
Density Range |
4-32 GB |
4-32GB |
8-16GB |
|
Data Retention |
10 years @ life begin |
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|
Endurance |
4.0 |
1.8 |
4.1 |
|
Operating Temperature |
Commercial: 0°C to +70°C |
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|
Storage Temperature |
-40°C to +100°C |
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|
Performance Sequential Read (MB/s) |
up to 174 |
up to 175 |
up to 180 |
|
MTBF |
≥ 3,000,000 hours |
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|
Shock |
1500 G |
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|
Vibration |
50 G |
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|
Humidity |
85 % RH 85°C, 1000 hrs |
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|
Voltage |
3.3 V ± 5 % / 5 V ± 10 % |
||
|
Features & Tools |
Page based FTL for best write performance and endurance Proven Power Fail Safety Windows / Linux – Spare block read out Bootable USB Drive Supports latest OS as Fixed Drive Connector pitch & key variations available Shock & vibration resistant |
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Various effects like data retention, read disturb limits, or temperature can impact data reliability. The latest generation of Swissbit products use special methods to maintain and refresh the data for higher data integrity.
The Swissbit Life Time Monitoring feature enables users to access the memory device’s detailed Life Time Status and allows prediction of imminent failure, avoiding unexpected data loss. This feature uses an extended S.M.A.R.T. (Self-Monitoring, Analysis and Reporting Technology) interface or vendor-specific commands to retrieve the Flash product information.
The longevity product lines use special components with a long-term supply commitment of up to 10 years. These products offer lowest TCO in demanding applications with high requalification cost.
Intelligent Power Fail Protection and Recovery protects data from unexpected power loss. During an unintentional shutdown, firmware routines and an intelligent hardware architecture ensure that all system and user data will be stored to the NAND.
Robustness is one of our key specification targets. The design, assembly and use of selected materials guarantee an extremely solid design which has been validated by extensive testing.
The WAF (write amplification factor) for MLC-based products is reduced by combining a paged based FW block management with a powerful card architecture and configuration settings.
Sophisticated Wear Leveling and Bad Block Management ensure that Flash cells are sparingly and equally used in order to prolong life time of the device.
Swissbit‘s embedded memory and storage solutions are designed and approved for reliable operation over a wide temperature range. The products are verified at temperature corners and prestressed with a burn-in operating functional test (Test During Burn In – TDBI).