PU-50n / PU-56n NANO

  • PU-56n everbit™ pSLC / PU-50n MLC durabit™
  • USB 3.1 – super speed
  • Configurable data protection
  • Multiple partitions (CDROM, Pin controlled, hidden)
  • Software tool for authentication
  • Industrial temp. range -25°C to 85°C and 0°C to 70°C
  • Page based FTL for best write performance and endurance
  • Robust housing with LED
Edition DP
Edition PE
Edition WORM/TSE
Features
Life Time Monitoring (LTM)
Life time monitoring (LTM)

The Swissbit Life Time Monitoring feature enables users to access the memory device’s detailed Life Time Status and allows prediction of imminent failure, avoiding unexpected data loss. This feature uses an extended S.M.A.R.T. (Self-Monitoring, Analysis and Reporting Technology) interface or vendor-specific commands to retrieve the Flash product information.

Power Fail Protection & Recovery
Power fail protection

Intelligent Power Fail Protection and Recovery protects data from unexpected power loss. During an unintentional shutdown, firmware routines and an intelligent hardware architecture ensure that all system and user data will be stored to the NAND.

Secure erase
Secure erase (Sanitize / Purge) / Fast erase

This feature uses an uninterruptable sequence of data erase commands. Even a power off can’t stop the process, which will continue upon restoration of power. The optional enhanced feature allows the customer to sanitize the data according to different standards like DoD, NSA, IREC, etc. The purge algorithm can be started by a software command or through a hardware pin.

Shock & Vibration
Shock and vibration

Robustness is one of our key specification targets. The design, assembly and use of selected materials guarantee an extremely solid design which has been validated by extensive testing.

Write Amplification Factor
WAF reduction

The WAF (write amplification factor) for MLC-based products is reduced by combining a paged based FW block management with a powerful card architecture and configuration settings.

Wear leveling
Wear leveling

Sophisticated Wear Leveling and Bad Block Management ensure that Flash cells are sparingly and equally used in order to prolong life time of the device.

Wide temperature support
Wide temperature support

Swissbit‘s embedded memory and storage solutions are designed and approved for reliable operation over a wide temperature range. The products are verified at temperature corners and prestressed with a burn-in operating functional test (Test During Burn In – TDBI).

Tables

 

PU-50n

PU-56n

COMPLIANCE

USB 3.1

USB 3.1

DATA TRANSFER USB 3.1
SuperSpeed
USB 3.1
SuperSpeed

TEMPERATURE

-25°C to 85°C -25°C to 85°C

COMPATIBLE TO

U-50n

U-56n

FLASH TYPE

MLC

pSLC

DENSITY DP Data Protection

8 GB - 64 GB

4 GB - 32 GB

DENSITY PE Premium Edition

8 GB - 16 GB

 

DENSITY WORM/TSE

8 GB

 

 

Downloads