2.5″ SATA
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X-76
- 3D NAND pSLC up to 640 GB density
- Highest endurance of 3D NAND SSDs
- temperature range up to -40°C to 85°C
- High IOPS without power fail compromise
- Extended S.M.A.R.T. values and tools (API)
- Data Care Management / NCQ / TRIM
- AES 256 bit Encryption
X-75
- 3D NAND up to 1920 GB density
- temperature range up to -40°C to 85°C
- High IOPS without power fail compromise
- Robust and rugged housing
- Extended S.M.A.R.T. values and tools (API)
- Data Care Management / NCQ / TRIM
- AES 256 bit Encryption
X-73
- 3D NAND up to 960 GB density
- temperature range up to -40°C to 85°C
- High IOPS without power fail compromise
- For cost sensitive applications
- Extended S.M.A.R.T. values and tools (API)
- Data Care Management / NCQ / TRIM
- AES 256 bit Encryption
X-70
- 3D NAND up to 960 GB density
- temperature range 0°C to 75°C
- High IOPS without power fail compromise
- Robust and rugged housing
- S.M.A.R.T. values and tools (API)
- NCQ, TRIM support
X-60 / X-66 / X-600
- SLC, pSLC or MLC up to 960 GB density
- temperature range up to -40°C to 85°C
- High IOPS without power fail compromise
- Robust and rugged housing
- Extended S.M.A.R.T. values and tools (API)
- NCQ, TRIM support
Swissbit’s 2.5” SSDs are ideal solutions for embedded applications requiring reliable and long service life storage. The new industrial 3D NAND based SSDs X-75, X-73 and the 3D NAND pSLC offer highest endurance and reliability and full industrial temperature range.
Still available are the X-60 SATA 6Gb/s series which is Swissbit’s MLC based solution for high performance, X-600 with best-in-class endurance, using SLC technology and X-66 as the perfect compromise with MLC NAND in pSLC mode.
ALL products feature Swissbit’s proven Power Fail Safety, Data Care Management, a detailed S.M.A.R.T.-based Life Time Monitoring, NCQ, TRIM, advanced wear leveling, bad block management and in-field firmware update functionality.
The X-75 supports AES 256 encryption and optional TCG Opal support.
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Series Name |
X-500 |
X-600 |
X-60 / X-66 |
X-76 / X-75 |
X-73 | X-70 |
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Standard & Interface |
SATA II – 3 Gbit/s up to UDMA6 / PIO4 / MDMA2 |
SATA III – 6 Gbit/s ATA8 |
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Package |
SATA 2.5" SSD |
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Connector |
15 + 7 pin Serial ATA |
15 + 7 pin Serial ATA | ||||
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Outline Dimensions |
100.2 x 69.85 x 9.3 mm |
100.2 x 69.85 x 7.0 mm
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Flash Type |
SLC |
pSLC / MLC |
3D NAND pSLC / TLC |
3D NAND TLC |
3D NAND TLC |
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Density Range |
16 GB – 512 GB |
8 GB - 256 GB |
pSLC: X-66: 16 GB - 240 GB MLC: X-60: 30 GB - 960 GB |
X-75: 10 GB – 640 GB X-75: 30 GB - 1920 GB |
60 GB – 960 GB |
60 GB – 480 GB |
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Data Retention |
10 years @ life begin 1 year @ life end |
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Endurance |
5.8 TBW |
8.7 TBW |
3.8 / 0.6 TBW |
6.3 / 0.6 TBW |
0.6 TBW |
0.9 TBW |
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Operating Temperature |
Commercial: 0°C to +70°C Industrial: -40°C to +85°C |
0°C to +70°C |
0°C to +70°C |
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Storage Temperature |
-55°C to + 95°C |
-40°C to + 85°C |
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Performance Sequential Read (MB/s) Sequential Write (MB/s) Random 4KB Read (IOPS) Random 4KB Write (IOPS) |
up to 240 up to 220 up to 14,500 up to 5,300 |
up to 520 up to 425 up to 79,000 up to 76,000 |
up to 520 / 525 up to 450 / 460 up to 74,000 / 74,500 up to 75,000 / 77,900 |
up to 565 / 565 up to 480 / 495 up to 77,400 / 74,100 up to 82,600 / 79,000 |
up to 565 up to 495 up to 74,100 up to 79,000 |
up to 560 up to 465 up to 83,500 up to 66,900 |
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MTBF |
≥ 2,000,000 hours |
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Shock |
1,500G, 0.5 ms |
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Vibration |
50 G, 131-2,000 Hz |
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Humidity |
85 % RH 85°C, 1,000 hrs |
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Voltage |
5 V ± 10 % / 3.3 V optional |
5 V ± 10 % |
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Power Consumption |
idle 200 mA max 700 mA |
idle 60 mA max 1,200 mA |
idle 125 mA max 725 mA |
idle 125 mA max 725 mA |
idle 100 mA max 650 mA |
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Features & Tools |
Proven Power Fail Safety ATA security feature set Enhanced Secure Erase, Purge & Sanitize NCQ, TRIM Advanced Wear Leveling & Bad Block In-field firmware update SBLTM Tool & SDK for S.M.A.R.T. based |
Proven Power Fail Safety NCQ, TRIM Advanced Wear Leveling & Bad Block management In-field firmware update detailled S.M.A.R.T. based Life Time Monitoring tool AES 256 (SED) / TCG Opal E2E Data Protection Robust housing |
Proven Power Fail Safety NCQ, TRIM Advanced Wear Leveling & Bad Block management In-field firmware update detailled S.M.A.R.T. based Life Time Monitoring tool AES 256 (SED) / TCG Opal E2E Data Protection
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Proven Power Fail Safety NCQ, TRIM Advanced Wear Leveling & Bad Block management In-field firmware update S.M.A.R.T. based Life Time Monitoring tool |
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Part Number |
SFSAxxxxQvBJxss-t-dd-rrr-ccc |
SFSAxxxxQvAAxss-t-dd-rrr-ccc |
SFSAxxxxQvAHxss-t-dd-rrr-ccc |
SFSAxxxxQvAHxss-t-dd-rrr-ccc |
SFSAxxxxQvAHxss-t-dd-rrr-ccc |
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Product Features
Data Care Management
Various effects like data retention, read disturb limits, or temperature can impact data reliability. The latest generation of Swissbit products use special methods to maintain and refresh the data for higher data integrity.
ESD and EMI safe
The product designs are in line with the latest regulations for electrostatic discharge and electromagnetic interference. Swissbit strives to exceed these limits with our own in-house technology and production capabilities, for example with System-in-Package (SiP) competence.
Life time monitoring (LTM)
The Swissbit Life Time Monitoring feature enables users to access the memory device’s detailed Life Time Status and allows prediction of imminent failure, avoiding unexpected data loss. This feature uses an extended S.M.A.R.T. (Self-Monitoring, Analysis and Reporting Technology) interface or vendor-specific commands to retrieve the Flash product information.
Power fail protection
Intelligent Power Fail Protection and Recovery protects data from unexpected power loss. During an unintentional shutdown, firmware routines and an intelligent hardware architecture ensure that all system and user data will be stored to the NAND.
Secure erase (Sanitize / Purge) / Fast erase
This feature uses an uninterruptable sequence of data erase commands. Even a power off can’t stop the process, which will continue upon restoration of power. The optional enhanced feature allows the customer to sanitize the data according to different standards like DoD, NSA, IREC, etc. The purge algorithm can be started by a software command or through a hardware pin.
Shock and vibration
Robustness is one of our key specification targets. The design, assembly and use of selected materials guarantee an extremely solid design which has been validated by extensive testing.
Temperature sensor
The sensor allows the host hardware or software to monitor the memory device temperature to improve data reliability in the target application environment.
Trim support
The TRIM command allows the operating system to inform the SSD which blocks of data are no longer considered in use and can be wiped out internally, which increases system performance in following write accesses. With TRIM Support data scrap can be deleted in advance, which otherwise would slow down future write operations to the involved blocks.
WAF reduction
The WAF (write amplification factor) for MLC-based products is reduced by combining a paged based FW block management with a powerful card architecture and configuration settings.
Wear leveling
Sophisticated Wear Leveling and Bad Block Management ensure that Flash cells are sparingly and equally used in order to prolong life time of the device.
Wide temperature support
Swissbit‘s embedded memory and storage solutions are designed and approved for reliable operation over a wide temperature range. The products are verified at temperature corners and prestressed with a burn-in operating functional test (Test During Burn In – TDBI).