CompactFlash Cards™


現在でも、CompactFlash™(CF)カードは、組込みおよび産業市場で広く使用されているフラッシュベースのストレージソリューションであり、CompactFlash ™カードのフォームファクタとコネクタは厳しい環境での用途に最適です。Swissbit の CF カードは、品質や信頼性、堅牢性や長期供給性にフォーカスして開発しています。高品質のコンポーネントのみを選択し、お客様の厳しい要件に適合する設計ルールを適用します。ハードウェアとファームウェアは、Swissbit の経験豊富な技術チームによってテストおよび認定されており、機能は、お客様の厳しい環境で実証済みです。

Swissbit の CF シリーズ C-350、C-5×0 の動作保証温度は0 ℃~70 ℃と-40 ℃~85 ℃の2つの温度範囲を用意しています。堅牢で信頼性の高いメモリは要求の厳しいさまざまな用途に対応します。互換性、ブート、および電源断対策から、長期供給、制御された BOM、優れたフラッシュプロトコル処理技術まで、さまざまな懸念事項を解決して、可能な限り最高のデータ整合性を確保するように設計されています。Swissbit は特に、一般的に推進されるシーケンシャルパフォーマンス値とは対照的に、従来の組込み CompactFlash アプリケーションの主要な要件の 1 つである、最適化されたランダムアクセス速度に重点を置いています。

C-350シリーズのCF カードは旧設計のHOSTに最適化されています。このシリーズは、信頼性の高い SLC フラッシュと 100’000 プログラム/イレースサイクルを使用して、32 MB から 256 MB までの低容量を実現します。

最新ファミリーの C-500、C-50、C-56 シリーズは、ページベースのフラッシュマネジメントにより、高速 IOPS と優れた書換え寿命を実現しています。

Series Name

C-350

C-300L

C-500

C-56

Interface

CFA4.1

CFA5.0 / CFA6.1 compatible

Interface
Data Transfer Mode

True IDE / PC card – Up to
UDMA4, MDMA4 & PIO6

True IDE / PC card – Up to
UDMA6, MDMA4 & PIO6

Connector

CFC Type I

Outline Dimensions

36.4 x 42.8 x 3.3 mm

Flash Type

SLC

pSLC

Density Range

32-256 MB

128 MB-1 GB

512 MB-64 GB

4-64 GB

Data Retention

10 years @ life begin
1 year @ life end

Endurance [DWPD]

JESD219 Client Endurance Workload

max 3.4

 

max 3.50

max 1.35

Operating Temperature

Commercial: 0°C to +70°C
Industrial: -40°C to +85°C

Storage Temperature

-40°C to +85°C

Performance

Sequential Read (MB/s)

Sequential Write (MB/s)

Random 4KB Read (IOPS)

Random 4KB Write (IOPS)

 

up to 22
up to 10
up to 3,000
up to 50

 

up to 22
up to 10
up to 3,000
up to 50

 

up to 64
up to 44
up to 3,200
up to 1,900

 

up to 115
up to 66
up to 5,000
up to 3,300

MTBF

≥ 3,000,000 hours

Shock

1,500 G

Vibration

20 G

Humidity

85 % RH 85°C, 1,000 hrs

Voltage

3.3 V ± 10 %
5 V ± 10 %

Features & Tools

Proven Power Fail Safety
Security & SBZoneProtection features
available
SBDM Tool & SDK for S.M.A.R.T. based Life
Time Monitoring
Page based FTL for maximum Endurance
Proven Power Fail Safety
Read Disturb Management
TRIM
Security & SBZoneProtection features available
SBDM Tool & SDK for S.M.A.R.T.
based Life Time Monitoring
Data care management
Data Care Management

Various effects like data retention, read disturb limits, or temperature can impact data reliability. The latest generation of Swissbit products use special methods to maintain and refresh the data for higher data integrity.

Electrostatic discharge and electromagnetic interference
ESD and EMI safe

The product designs are in line with the latest regulations for electrostatic discharge and electromagnetic interference. Swissbit strives to exceed these limits with our own in-house technology and production capabilities, for example with System-in-Package (SiP) competence.

Life Time Monitoring (LTM)
Life time monitoring (LTM)

The Swissbit Life Time Monitoring feature enables users to access the memory device’s detailed Life Time Status and allows prediction of imminent failure, avoiding unexpected data loss. This feature uses an extended S.M.A.R.T. (Self-Monitoring, Analysis and Reporting Technology) interface or vendor-specific commands to retrieve the Flash product information.

Power Fail Protection & Recovery
Power fail protection

Intelligent Power Fail Protection and Recovery protects data from unexpected power loss. During an unintentional shutdown, firmware routines and an intelligent hardware architecture ensure that all system and user data will be stored to the NAND.

Secure erase
Secure erase (Sanitize / Purge) / Fast erase

This feature uses an uninterruptable sequence of data erase commands. Even a power off can’t stop the process, which will continue upon restoration of power. The optional enhanced feature allows the customer to sanitize the data according to different standards like DoD, NSA, IREC, etc. The purge algorithm can be started by a software command or through a hardware pin.

Shock & Vibration
Shock and vibration

Robustness is one of our key specification targets. The design, assembly and use of selected materials guarantee an extremely solid design which has been validated by extensive testing.

Write Amplification Factor
WAF reduction

The WAF (write amplification factor) for MLC-based products is reduced by combining a paged based FW block management with a powerful card architecture and configuration settings.

Wear leveling
Wear leveling

Sophisticated Wear Leveling and Bad Block Management ensure that Flash cells are sparingly and equally used in order to prolong life time of the device.

Wide temperature support
Wide temperature support

Swissbit‘s embedded memory and storage solutions are designed and approved for reliable operation over a wide temperature range. The products are verified at temperature corners and prestressed with a burn-in operating functional test (Test During Burn In – TDBI).